Band profiles of ZnMgO/ZnO heterostructures confirmed by Kelvin probe force microscopy

被引:34
|
作者
Tampo, H. [1 ]
Shibata, H. [1 ]
Maejima, K. [1 ]
Chiu, T. -W. [1 ]
Itoh, H. [1 ]
Yamada, A. [1 ]
Matsubara, K. [1 ]
Fons, P. [1 ]
Chiba, Y. [2 ]
Wakamatsu, T. [2 ]
Takeshita, Y. [2 ]
Kanie, H. [2 ]
Niki, S. [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
[2] Tokyo Univ Sci, Chiba 2788510, Japan
关键词
atomic force microscopy; II-VI semiconductors; magnesium compounds; Poisson equation; Schrodinger equation; semiconductor heterojunctions; surface states; two-dimensional electron gas; zinc compounds; WORK FUNCTION; ZNO;
D O I
10.1063/1.3157149
中图分类号
O59 [应用物理学];
学科分类号
摘要
The band profiles of ZnMgO/ZnO heterostructures were confirmed through surface potential measurements by Kelvin probe force microscopy. A simple model for the band profile was proposed and the various band parameters were evaluated experimentally and theoretically based on the band model. The band profile was calculated and validated with experimental results using the Schroumldinger-Poisson equation. The energy level of the ZnMgO surface donor state, which serves as the source of the two-dimensional electron gas in ZnMgO/ZnO heterostructures, was estimated from the band parameters; nearly identical energy levels around 0.8 eV were obtained for Zn(1-x)Mg(x)O layers with Mg compositions x ranging from 0.12 to 0.42 and the corresponding charge densities were estimated to be 8x10(12) cm(-2).
引用
收藏
页数:3
相关论文
共 50 条
  • [41] Noncontact atomic force and Kelvin probe force microscopy on MgO(100) and MgO(100)-supported Ba
    Pang, Chi Lun
    Sasahara, Akira
    Onishi, Hiroshi
    SURFACE SCIENCE, 2016, 650 : 76 - 82
  • [42] Probing CO on a rutile TiO2(110) surface using atomic force microscopy and Kelvin probe force microscopy
    Adachi, Yuuki
    Sugawara, Yasuhiro
    Li, Yan Jun
    NANO RESEARCH, 2022, 15 (03) : 1909 - 1915
  • [43] Probing CO on a rutile TiO2(110) surface using atomic force microscopy and Kelvin probe force microscopy
    Yuuki Adachi
    Yasuhiro Sugawara
    Yan Jun Li
    Nano Research, 2022, 15 : 1909 - 1915
  • [44] Microelectrical characterizations of junctions in solar cell devices by scanning Kelvin probe force microscopy
    Jiang, C. -S.
    Ptak, A.
    Yan, B.
    Moutinho, H. R.
    Li, J. V.
    Al-Jassim, M. M.
    ULTRAMICROSCOPY, 2009, 109 (08) : 952 - 957
  • [45] Characterization of graphene layers by Kelvin probe force microscopy and micro-Raman spectroscopy
    Nazarov, A. N.
    Gordienko, S. O.
    Lytvyn, P. M.
    Strelchuk, V. V.
    Nikolenko, A. S.
    Vasin, A. V.
    Rusavsky, A. V.
    Lysenko, V. S.
    Popov, V. P.
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 10, NO 7-8, 2013, 10 (7-8): : 1172 - 1175
  • [46] Surface Potential Analysis of Nanoscale Biomaterials and Devices Using Kelvin Probe Force Microscopy
    Lee, Hyungbeen
    Lee, Wonseok
    Lee, Jeong Hoon
    Yoon, Dae Sung
    JOURNAL OF NANOMATERIALS, 2016, 2016
  • [47] Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water
    Kilpatrick J.I.
    Kargin E.
    Rodriguez B.J.
    Beilstein Journal of Nanotechnology, 2022, 13 : 922 - 943
  • [48] Surface potential images of polycrystalline organic semiconductors obtained by Kelvin probe force microscopy
    Huang, Haichao
    Wang, Haibo
    Zhang, Jidong
    Yan, Donghang
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2009, 95 (01): : 125 - 130
  • [49] Characterizing defects and transport in Si nanowire devices using Kelvin probe force microscopy
    Bae, S-S
    Prokopuk, N.
    Quitoriano, N. J.
    Adams, S. M.
    Ragan, R.
    NANOTECHNOLOGY, 2012, 23 (40)
  • [50] Charge injection in large area multilayer graphene by ambient Kelvin probe force microscopy
    Bdikin, Igor
    Sharma, Dhanajay K.
    Otero-Lrurueta, Gonzalo
    Hortiguela, Maria J.
    Tyagi, Pawan K.
    Neto, Victor
    Singh, Manoj K.
    APPLIED MATERIALS TODAY, 2017, 8 : 18 - 25