Band profiles of ZnMgO/ZnO heterostructures confirmed by Kelvin probe force microscopy

被引：34
|
作者：
Tampo, H. [1 ]
Shibata, H. [1 ]
Maejima, K. [1 ]
Chiu, T. -W. [1 ]
Itoh, H. [1 ]
Yamada, A. [1 ]
Matsubara, K. [1 ]
Fons, P. [1 ]
Chiba, Y. [2 ]
Wakamatsu, T. [2 ]
Takeshita, Y. [2 ]
Kanie, H. [2 ]
Niki, S. [1 ]
机构：
[1] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
[2] Tokyo Univ Sci, Chiba 2788510, Japan
来源：
APPLIED PHYSICS LETTERS | 2009年 / 94卷 / 24期
关键词：
atomic force microscopy; II-VI semiconductors; magnesium compounds; Poisson equation; Schrodinger equation; semiconductor heterojunctions; surface states; two-dimensional electron gas; zinc compounds; WORK FUNCTION; ZNO;
D O I：
10.1063/1.3157149
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The band profiles of ZnMgO/ZnO heterostructures were confirmed through surface potential measurements by Kelvin probe force microscopy. A simple model for the band profile was proposed and the various band parameters were evaluated experimentally and theoretically based on the band model. The band profile was calculated and validated with experimental results using the Schroumldinger-Poisson equation. The energy level of the ZnMgO surface donor state, which serves as the source of the two-dimensional electron gas in ZnMgO/ZnO heterostructures, was estimated from the band parameters; nearly identical energy levels around 0.8 eV were obtained for Zn(1-x)Mg(x)O layers with Mg compositions x ranging from 0.12 to 0.42 and the corresponding charge densities were estimated to be 8x10(12) cm(-2).
引用
收藏
页数：3
相关论文
共 50 条
  • [1] Zn1-xMgxO/ZnO heterostructures studied by Kelvin probe force microscopy conjunction with probe characterizer
    Chiu, Te-Wei
    Itoh, Hiroshi
    Tampo, Hitoshi
    Niki, Shigeru
    APPLIED SURFACE SCIENCE, 2009, 256 (04) : 1180 - 1183
  • [2] Pulsed Force Kelvin Probe Force Microscopy
    Jakob, Devon S.
    Wang, Haomin
    Xu, Xiaoji G.
    ACS NANO, 2020, 14 (04) : 4839 - 4848
  • [3] Pulsed Force Kelvin Probe Force Microscopy-A New Type of Kelvin Probe Force Microscopy under Ambient Conditions
    Zahmatkeshsaredorahi, Amirhossein
    Jakob, Devon S.
    Xu, Xiaoji G.
    JOURNAL OF PHYSICAL CHEMISTRY C, 2024, 128 (24) : 9813 - 9827
  • [4] Kelvin Probe Force Microscopy in Nonpolar Liquids
    Domanski, Anna L.
    Sengupta, Esha
    Bley, Karina
    Untch, Maria B.
    Weber, Stefan A. L.
    Landfester, Katharina
    Weiss, Clemens K.
    Butt, Hans-Juergen
    Berger, Ruediger
    LANGMUIR, 2012, 28 (39) : 13892 - 13899
  • [5] On the deconvolution of Kelvin probe force microscopy data
    Bluemel, A.
    Plank, H.
    Klug, A.
    Fisslthaler, E.
    Sezen, M.
    Grogger, W.
    List, E. J. W.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2010, 81 (05)
  • [6] Kelvin probe force microscopy study on nanotriboelectrification
    Sun, Hao
    Chu, Haibin
    Wang, Jinyong
    Ding, Lei
    Li, Yan
    APPLIED PHYSICS LETTERS, 2010, 96 (08)
  • [7] Characterization of band alignment at a metal-MoS2 interface by Kelvin probe force microscopy
    Okada, Mitsuhiro
    Okigawa, Yuki
    Fujii, Takeshi
    Endo, Takahiko
    Chang, Wen Hsin
    Okada, Naoya
    Irisawa, Toshifumi
    Miyata, Yasumitsu
    Shimizu, Tetsuo
    Kubo, Toshitaka
    Yamada, Takatoshi
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2024, 63 (01)
  • [8] Three-Dimensional Kelvin Probe Force Microscopy
    Geng, Junyuan
    Zhang, Hao
    Meng, Xianghe
    Gao, Haibo
    Rong, Weibin
    Xie, Hui
    ACS APPLIED MATERIALS & INTERFACES, 2022, 14 (28) : 32719 - 32728
  • [9] Local measurement of semiconductor band bending and surface charge using Kelvin probe force microscopy
    Saraf, S
    Rosenwaks, Y
    SURFACE SCIENCE, 2005, 574 (2-3) : L35 - L39
  • [10] Kelvin probe force microscopy imaging using carbon nanotube probe
    Takahashi, S
    Kishida, T
    Akita, S
    Nakayama, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (6B): : 4314 - 4316
12345