Semiparametric Inference for the Two-way Layout Under Order Restrictions

被引:7
作者
Davidov, Ori [1 ]
Fokianos, Konstantinos [2 ]
Iliopoulos, George [3 ]
机构
[1] Univ Haifa, Dept Stat, IL-31999 Haifa, Israel
[2] Univ Cyprus, Dept Math & Stat, Nicosia, Cyprus
[3] Univ Piraeus, Dept Stat & Insurance Sci, Piraeus 18534, Greece
关键词
density ratio model; likelihood ratio order; maximum likelihood; model misspecification; two-way layout; BIASED SAMPLING MODELS; GENERALIZED LINEAR-MODELS; GOODNESS-OF-FIT; FACTORIAL-DESIGNS; NONPARAMETRIC HYPOTHESES; EMPIRICAL DISTRIBUTIONS; TESTS; VARIANCE;
D O I
10.1111/sjos.12052
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
There are many situations in which a researcher would like to analyse data from a two-way layout. Often, the assumptions of linearity and normality may not hold. To address such situations, we introduce a semiparametric model. The model extends the well-known density ratio model from the one-way to the two-way layout and provides a useful framework for semiparametric analysis of variance type problems under order restrictions. In particular, the likelihood ratio order is emphasized. The model enables highly efficient inference without resorting to fully parametric assumptions or the use of transformations. Estimation and testing procedures under order restrictions are developed and investigated in detail. It is shown that the model is robust to misspecification, and several simulations suggest that it performs well in practice. The methodology is illustrated using two data examples; in the first, the response variable is discrete, whereas in the second, it is continuous.
引用
收藏
页码:622 / 638
页数:17
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