Improving the spatial and statistical accuracy in X-ray Raman scattering based direct tomography

被引：12

作者：

Sahle, Ch J. ^{[1
]}

Mirone, A. ^{[1
]}

Vincent, T. ^{[1
]}

Kallonen, A. ^{[2
]}

Huotari, S. ^{[2
]}

机构：

[1] European Synchrotron Radiat Facil, 71 Ave Martyrs, F-38000 Grenoble, France

[2] Univ Helsinki, Dept Phys, POB 64, FI-00014 Helsinki, Finland

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2017年 / 24卷

基金：

芬兰科学院;

关键词：

inelastic X-ray scattering; imaging; direct tomography; XRS; IMAGE;

D O I：

10.1107/S1600577517000169

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An algorithm to simultaneously increase the spatial and statistical accuracy of X-ray Raman scattering (XRS) based tomographic images is presented. Tomography that utilizes XRS spectroscopy signals as a contrast for the images is a new and promising tool for investigating local atomic structure and chemistry in heterogeneous samples. The algorithm enables the spatial resolution to be increased based on a deconvolution of the optical response function of the spectrometer and, most importantly, it allows for the combination of data collected from multiple analyzers and thus enhances the statistical accuracy of the measured images.

引用

页码：476 / 481

页数：6

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