Dark I-V curve measurement of single cells in a photovoltaic module

被引：12

作者：

De Bernardez, L.

Buitrago, R. H.

机构：

[1] Univ Nacl Litoral, Fac Ingn & Ciencias Hidricas, RA-3000 Santa Fe, Argentina

[2] Univ Nacl Litoral, Inst Desarrollo Tecnol Ind Quim INTEC, CONICET, RA-3000 Santa Fe, Argentina

[3] Univ Nacl Litoral, Fac Ingn Quim, Dept Fis, RA-3000 Santa Fe, Argentina

来源：

PROGRESS IN PHOTOVOLTAICS | 2006年 / 14卷 / 04期

关键词：

dark I-V curves; degradation; electrical model; photovoltaic module;

D O I：

10.1002/pip.665

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

A simple method of obtaining single cell dark I-V curves in a photovoltaic module was developed. The method does not require disassembling the module and was verified experimentally. From the dark I-V curves, the cell characteristic parameters were obtained. By following the time evolution of the characteristic parameters it is possible to determine the main degradation mechanisms and predict the mean life time of the module before failure. Copyright (C) 2005 John Wiley & Sons, Ltd.

引用

页码：321 / 327

页数：7

共 12 条

[1] Effect of variation of I01/I02 on short-circuit current and fill factor of a real solar cell having resistive and current leakage losses [J].