A Wideband Tangential Electric Field Probe and a New Calibration Kit for Near-Field Measurements

被引：14

作者：

He, Zheng ^{[1
]}

Wang, Lixiao ^{[1
]}

Chen, Longbin ^{[1
]}

Luo, Ruichen ^{[1
]}

Liu, Qing Huo ^{[2
]}

机构：

[1] Xiamen Univ, Fujian Engn Res Ctr Elect Design Automat EDA, Inst Electromagnet & Acoust, Xiamen 361005, Peoples R China

[2] Duke Univ, Dept Elect & Comp Engn, Durham, NC 27708 USA

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2022年 / 70卷 / 07期

基金：

中国国家自然科学基金;

关键词：

Probes; Baluns; Microstrip; Slot lines; Calibration; Wideband; Frequency measurement; Calibration kit; near-field measurement; slotline; tangential electric field (E-field) probe; wideband balun;

D O I：

10.1109/TMTT.2022.3174593

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A wideband tangential electric field (E-field) probe with operating frequency of 4-15 GHz is proposed. The E-field probe is designed on a four-layer printed circuit board (PCB) with high-performance Rogers substrate. A wideband balun based on a microstrip-to-slotline transition structure is integrated into the probe to realize balanced-unbalanced transform in a wide frequency band through field conversion. Numerical simulations show that the magnitude imbalance and the phase imbalance of the balun are below 1 dB and 1 degrees, respectively. To reduce the interference of the normal E-field component to the calibration result, the slotline is used as a calibration kit to generate the standard field because of its excellent field distribution characteristics. The tangential E-field probe placed at the center of a slotline for calibration captures the symmetrical E-field, while the normal component regarded as interference can be suppressed by the wideband balun. The performance of proposed probe is demonstrated with simulation and laboratory experiments.

引用

页码：3557 / 3565

页数：9

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