Use of Kelvin probe force microscopy to achieve a locally and time-resolved analysis of the photovoltage generated in dye-sensitized ZnO electrodes

被引:2
作者
Beu, Max [1 ]
Klinkmueller, Kathleen [1 ]
Schlettwein, Derck [1 ]
机构
[1] Univ Giessen, Inst Appl Phys, D-35392 Giessen, Germany
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2014年 / 211卷 / 09期
关键词
atomic force microscopy; dyes; Kelvin probe; semiconductors; sensitization; ZnO; INDOLINE DYE; SOLAR-CELLS; PERFORMANCE; FILMS;
D O I
10.1002/pssa.201431336
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Kelvin probe force microscopy at air in the dark and under illumination by visible light was performed for electrodeposited porous ZnO films, which were sensitized by the indoline dye D149. A contact potential difference was measured that confirmed electron injection into the semiconductor matrix and their subsequent stabilization in trap states. A locally widely homogenous signal was observed speaking in favor of a well-crystallized sample. The rise and decay times of the photovoltage in the ms to s timescale could be analyzed by use of individual scan lines or scanned images, respectively. The results are discussed in the context of recent pump-probe spectroscopy results as well as such from photoelectrochemical experiments with such electrodes and implications will be deduced for their use in dye-sensitized solar cells. (C) 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:1960 / 1965
页数:6
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