In situ observation of growth process of α-L-glutamic acid with atomic force microscopy

被引:16
作者
Kitamura, M
Onuma, K
机构
[1] Hiroshima Univ, Dept Chem Engn, Hiroshima 7398527, Japan
[2] Natl Inst Adv Interdisciplinary Res, Tsukuba, Ibaraki 3058562, Japan
[3] Natl Inst Mat & Chem Res, Tsukuba, Ibaraki 3058562, Japan
关键词
atomic force microscopy; growth mechanism; amino acid; additive effect;
D O I
10.1006/jcis.1999.6686
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The growth kinetics of the (111) and (001) faces of an alpha-L-glutamic acid crystal was investigated from the measurements of the growth rates, coupling with in situ surface observation using atomic force microscopy (AFM), The data of the growth rates were examined by applying the theoretical equations of the BCF and NaN models. The results indicate that the growth mechanism is not due to the screw dislocation but to the two-dimensional nucleation, i.e,, the NaN model, It was confirmed by AFM observation that both the (111)and (001) faces grew with the "nucleus above nucleus" (NaN) mechanism. However, the difference of the two-dimensional nucleation behavior was observed between the faces. The growing surface of the (111) face was also observed in the presence of L-phenylaline (L-Phe) and the pinning effect by L-Phe on the growing step on the (111) face was confirmed. This result supports the mechanism of the additive effect, which was proposed previously. : (C) 2000 Academic Press.
引用
收藏
页码:311 / 316
页数:6
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