Using FOCUS and Superflip to solve structures from 3D electron and powder diffraction data.

被引：0

作者：

Smeets, Stef ^{[1
]}

McCusker, Lynne B. ^{[1
]}

Baerlocher, Christian ^{[1
]}

Mugnaioli, Enrico ^{[2
]}

Kolb, Ute ^{[2
]}

机构：

[1] Swiss Fed Inst Technol, Dept Mat, Crystallog Lab, Zurich, Switzerland

[2] Johannes Gutenberg Univ Mainz, Inst Phys Chem, D-55116 Mainz, Germany

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2013年 / 69卷

关键词：

electron diffraction; powder diffraction; structure determination;

D O I：

10.1107/S0108767313098978

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

MS17-05

引用

页码：S119 / S120

页数：2

共 5 条

Grosse-Kunstleve, RW ;

McCusker, LB ;

Baerlocher, C .

Mugnaioli, Enrico ;

Kolb, Ute .

Palatinus, Lukas ;

Chapuis, Gervais .

[4]

Smeets S, J APPL CRYSTAL UNPUB

[5] Collecting 3D electron diffraction data by the rotation method [J].

Zhang, Daliang ;

Oleynikov, Peter ;

Hovmoller, Sven ;

Zou, Xiaodong .

ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS, 2010, 225 (2-3) :94-102