Penetration of liquid gallium into the grain boundaries of aluminium: a synchrotron radiation microtomographic investigation

被引:96
作者
Ludwig, W
Bellet, D
机构
[1] ENSPG, INPG, F-38402 St Martin Dheres, France
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
来源
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2000年 / 281卷 / 1-2期
关键词
X-ray microtomography; grain boundary wetting; liquid-metal embrittlement;
D O I
10.1016/S0921-5093(99)00733-9
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The penetration of liquid metals into the grain boundaries of polycrystalline solid metals is a precursor process triggering liquid metal embrittlement for some specific metal couples. Synchrotron radiation X-ray microtomography is used to investigate the penetration of liquid gallium into the grain boundaries of aluminium. The large difference in absorption coefficients between Ga and Al allows micrometer thick liquid Ga films to be observed as they are wetting grain boundaries of Al. The effects of annealing are presented and discussed. This technique opens the way for in-situ measurements of the kinetics of liquid metal penetration in materials. It might also be used to visualise and analyse the three-dimensional grain structure of a metallic polycrystal. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:198 / 203
页数:6
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