ON THE STRUCTURE OF THIN WETTING FILMS.

被引：0

作者：

Doerr, A. ^{[1
]}

Press, W. ^{[1
]}

Tolan, M. ^{[1
]}

Schlomka, J. P. ^{[1
]}

Seydel, T. ^{[1
]}

Prange, W. ^{[1
]}

机构：

[1] Univ Kiel, Inst Expt & Angew Phys, D-24098 Kiel, Germany

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1999年 / 55卷

关键词：

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

M08.EE.005

引用

页码：104 / 105

页数：2

共 7 条

[1]

[Anonymous], UNPUB

[2]

Doerr A. K., 1999, THESIS

[3] The interface structure of thin liquid hexane films [J].

Doerr, AK ;

Tolan, M ;

Seydel, T ;

Press, W .

PHYSICA B, 1998, 248 :263-268

[4] SOLUTION OF THE INVERSE SCATTERING PROBLEM IN SPECULAR REFLECTION [J].

LIPPERHEIDE, R ;

REISS, G ;

LEEB, H ;

FIEDELDEY, H ;

SOFIANOS, SA .

PHYSICAL REVIEW B, 1995, 51 (16) :11032-11038

[5] DENSITY PROFILES AND PAIR CORRELATION-FUNCTIONS OF LENNARD-JONES FLUIDS NEAR A HARD-WALL [J].

PLISCHKE, M ;

HENDERSON, D .

JOURNAL OF CHEMICAL PHYSICS, 1986, 84 (05) :2846-2852

[6] X-RAY AND NEUTRON-SCATTERING FROM ROUGH SURFACES [J].

SINHA, SK ;

SIROTA, EB ;

GAROFF, S ;

STANLEY, HB .

PHYSICAL REVIEW B, 1988, 38 (04) :2297-2311

[7] COMPLETE WETTING OF A ROUGH-SURFACE - AN X-RAY STUDY [J].

TIDSWELL, IM ;

RABEDEAU, TA ;

PERSHAN, PS ;

KOSOWSKY, SD .

PHYSICAL REVIEW LETTERS, 1991, 66 (16) :2108-2111

← 1 →