Calibration stability of hot cathode ionization gauges: A discussion of the importance of electron path length and gauge constant

被引:3
作者
Peacock, RN
机构
[1] Lafayette, CO 80026
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 2002年 / 20卷 / 04期
关键词
Cathodes - Electric currents - Electric space charge - Electrons - Magnetic fields - Nitrogen - Pressure - Ultrahigh vacuum;
D O I
10.1116/1.1479358
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The ion current, i(+), in an ionization gauge is given by the equation i(+) = Ki _ P where K is a gas dependent gauge constant, i - is the electron current, and P is the pressure. Values of K for nitrogen C, for gauges designed for use at ultrahigh vacuum and extreme high vacuum range from 10/Torr to 10(6)/Torr. It is important to know whether calibration stability is sacrificed when K, and the electron path length are large. Using a simple model, the electron path length is estimated as a function of the probability, 8, that an electron will make another pass through the ionizing region. An equation is obtained for K as a function of beta. The fractional change in K, DeltaK/K, is zero for those gauges where the electrons make a single pass, but is increasingly larger for higher sensitivity gauges with C,greater probabilities of multiple passes. As an example, assume that the probability of the next pass changes by 1%, then the change in sensitivity is 1.5% for a B-A with K= 25/Torr, and 9% for a gauge with K= 10(2)/Torr. (C) 2002 American Vacuum Society.
引用
收藏
页码:1202 / 1204
页数:3
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