The Rietveld method

被引:255
作者
Rietveld, Hugo M.
机构
关键词
Rietveld method; powder diffraction; crystallopgraphic computing; REFINEMENT;
D O I
10.1088/0031-8949/89/9/098002
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A summary is given of the development of an improved method to handle powder diffraction data. The resulting method, now called the Rietveld method, uses powder diffraction step-scanned intensities instead of integrated powder intensities. This enables the full use of the information content of a powder diagram. The method has revitalized the use of powder diffraction in structure determination. An unexpected and later development is the use of the method in quantitative phase analysis. This is now an essential tool in many industrial processes.
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页数:6
相关论文
共 5 条
[1]   PHYSICS - X-RAY AND NEUTRON DIFFRACTION EXAMINATION OF P-DIPHENYLBENZENE [J].
CLEWS, CJ ;
MASLEN, EN ;
RIETVELD, HM .
NATURE, 1961, 192 (479) :154-&
[2]  
Rietveld H.M, 1963, THESIS U W AUSTR
[3]   LINE PROFILES OF NEUTRON POWDER-DIFFRACTION PEAKS FOR STRUCTURE REFINEMENT [J].
RIETVELD, HM .
ACTA CRYSTALLOGRAPHICA, 1967, 22 :151-&
[4]   CRYSTAL STRUCTURE OF SOME ALKALINE EARTH METAL URANATES OF TYPE M3UO6 [J].
RIETVELD, HM .
ACTA CRYSTALLOGRAPHICA, 1966, 20 :508-&
[5]   A PROFILE REFINEMENT METHOD FOR NUCLEAR AND MAGNETIC STRUCTURES [J].
RIETVELD, HM .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 :65-&