Application of the Kriging method to the reconstruction of ellipsometric signature

被引:5
作者
Afraites, L. [1 ,2 ]
Hazart, J. [3 ]
Schiavone, P. [1 ,4 ]
机构
[1] CNRS, Lab Technol Microelect, F-38054 Grenoble, France
[2] Univ Cadi Ayyad, ENSA Safi, Safi 46000, Morocco
[3] CEA LETI DOPT SINA, F-38054 Grenoble, France
[4] Georgia Inst Technol, Georgia Tech CNRS, UMI 2958, Atlanta, GA 30332 USA
关键词
Surface patterning; Scatterometry; Ellipsometry; Inverse problem; Kriging; Semivariogram;
D O I
10.1016/j.mee.2009.01.049
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The inverse problem in scatterometry which consists in determining the feature shape from an experimental ellipsometric signature is very difficult to solve. on one hand, the problem is ill-posed; on the other hand, due to equipment limitation and the presence of noise in the measurement, the number of experimental signature acquisition is limited to a few measurements. The efficient resolution of the inverse problem requires a more comprehensive signature. To deal with this problem, we use a new approach based on the Kriging interpolation method to enrich the number of usable data. This method is inherently providing the best linear unbiased optimal estimation. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:1033 / 1035
页数:3
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