Sampling measurement of soft-x-ray-pulse shapes by femtosecond sequential ionization of Kr+ in an intense laser field

被引：12
作者：
Oguri, K [1 ]
Nishikawa, T [1 ]
Ozaki, T [1 ]
Nakano, H [1 ]
机构：
[1] NTT Corp, NTT Basic Res Labs, Atsugi, Kanagawa 2430198, Japan
来源：
OPTICS LETTERS | 2004年 / 29卷 / 11期
关键词：
D O I：
10.1364/OL.29.001279
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We propose a sampling technique for measuring the shape of ultrashort soft-x-ray pulses. The technique uses the transient state of Kr+ ions that is produced by the femtosecond sequential evolution of Kr ions during optical-field-induced ionization as an ultrafast x-ray-absorption sampling gate. We demonstrate the technique by measuring the pulse shape of the 51st harmonic (15.6 mn) generated by a 100-fs titanium: sapphire laser pulse. The measured pulse duration is 220 fs. Our experimental result confirms that the sequential evolution of Kr+ ions from neutral Kr to Kr2+ is the dominant contribution to the ionization process from the aspect of time-domain measurement. (C) 2004 Optical Society of America.
引用
收藏
页码：1279 / 1281
页数：3
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