On the fundamental imaging-depth limit in two-photon microscopy

被引:314
|
作者
Theer, Patrick [1 ]
Denk, Winfried [1 ]
机构
[1] Max Planck Inst Med Res, D-69120 Heidelberg, Germany
关键词
D O I
10.1364/JOSAA.23.003139
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We have analyzed how the maximal imaging depth of two-photon microscopy in scattering samples depends on properties of the sample and the imaging system. We find that the imaging depth increases with increasing numerical aperture and staining inhomogeneity and with decreasing excitation-pulse duration and scattering anisotropy factor, but is ultimately limited by near-surface fluorescence with slight improvements possible using special detection strategies. (c) 2006 Optical Society of America.
引用
收藏
页码:3139 / 3149
页数:11
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