Linux file system;
FAT32;
Recovered file;
Creation time;
D O I:
10.1016/j.diin.2015.09.003
中图分类号:
TP [自动化技术、计算机技术];
学科分类号:
0812 ;
摘要:
Minnaard proposed a novel method that constructs a creation time bound of files recovered without time information. The method exploits a relationship between the creation order of files and their locations on a storage device managed with the Linux FAT32 file system. This creation order reconstruction method is valid only in non-wraparound situations, where the file creation time in a former position is earlier than that in a latter position. In this article, we show that if the Linux FAT32 file allocator traverses the storage space more than once, the creation time of a recovered file is possibly earlier than that of a former file and possibly later than that of a latter file on the Linux FAT32 file system. Also it is analytically verified that there are at most n candidates for the creation time bound of each recovered file where n is the number of traversals by the file allocator. Our analysis is evaluated by examining file allocation patterns of two commercial in-car dashboard cameras. (C) 2015 Elsevier Ltd. All rights reserved.
机构:
Netherlands Forens Inst, Dept Digital Technol & Biometry, NL-2490 AA The Hague, NetherlandsNetherlands Forens Inst, Dept Digital Technol & Biometry, NL-2490 AA The Hague, Netherlands
机构:
Netherlands Forens Inst, Dept Digital Technol & Biometry, NL-2490 AA The Hague, NetherlandsNetherlands Forens Inst, Dept Digital Technol & Biometry, NL-2490 AA The Hague, Netherlands
van Eijk, Onno
;
Roeloffs, Mark
论文数: 0引用数: 0
h-index: 0
机构:
Netherlands Forens Inst, Dept Digital Technol & Biometry, NL-2490 AA The Hague, NetherlandsNetherlands Forens Inst, Dept Digital Technol & Biometry, NL-2490 AA The Hague, Netherlands
机构:
Netherlands Forens Inst, Dept Digital Technol & Biometry, NL-2490 AA The Hague, NetherlandsNetherlands Forens Inst, Dept Digital Technol & Biometry, NL-2490 AA The Hague, Netherlands
机构:
Netherlands Forens Inst, Dept Digital Technol & Biometry, NL-2490 AA The Hague, NetherlandsNetherlands Forens Inst, Dept Digital Technol & Biometry, NL-2490 AA The Hague, Netherlands
van Eijk, Onno
;
Roeloffs, Mark
论文数: 0引用数: 0
h-index: 0
机构:
Netherlands Forens Inst, Dept Digital Technol & Biometry, NL-2490 AA The Hague, NetherlandsNetherlands Forens Inst, Dept Digital Technol & Biometry, NL-2490 AA The Hague, Netherlands