Modified chemical synthesis of porous α-Sm2S3 thin films

被引:16
作者
Kumbhar, V. S. [1 ]
Jagadale, A. D. [1 ]
Gaikwad, N. S. [2 ]
Lokhande, C. D. [1 ]
机构
[1] Shivaji Univ, Dept Phys, Thin Film Phys Lab, Kolhapur 416004, Maharashtra, India
[2] Rayat Shikshan Sanstha, Satara 415001, MS, India
关键词
Thin films; Chemical synthesis; X-ray diffraction; Atomic force microscopy; Crystal structure;
D O I
10.1016/j.materresbull.2014.04.020
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The paper reports synthesis of porous alpha-Sm2S3 thin films using modified chemical synthesis, also known as successive ionic layer adsorption and reaction (SILAR) method. The X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), atomic force microscopy (AFM), wettability and ultraviolet-visible spectroscopy (UV-vis) techniques are used for the study of structural, elemental, morphological and optical properties of alpha-Sm2S3 films. An orthorhombic crystal structure of alpha-Sm2S3 is resulted from XRD study. The SEM and AFM observations showed highly porous alpha-Sm2S3 film surface. An optical band gap of 2.50 eV is estimated from optical absorption spectrum. The porous alpha-Sm2S3 thin film tuned for supercapacitive behaviour using cyclic voltammetry and galvanostatic charge discharge showed a specific capacitance and energy density of 294 Fg(-1) and 48.9 kWkg(-1), respectively in 1 M LiClO4-propylene carbonate electrolyte. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码:39 / 44
页数:6
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