Electrically Driven Dynamics of Few-Chain NbSe3

被引：1

作者：

Thang Pham ^{[1
,2
,4
,5
]}

Zettl, Alex ^{[1
,3
,4
]}

机构：

[1] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

[2] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA

[3] Lawrence Berkeley Natl Lab, Mat Sci Div, 1 Cyclotron Rd, Berkeley, CA 94720 USA

[4] Univ Calif Berkeley, Kavli Energy Nanosci Inst, Berkeley, CA 94720 USA

[5] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA

来源：

PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2019年 / 256卷 / 12期

基金：

美国国家科学基金会;

关键词：

carbon nanotubes; electromigration; filled nanotubes; low-dimensional materials; transmission electron microscopy; CARBON NANOTUBES;

D O I：

10.1002/pssb.201900241

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

An in situ transmission electron microscopy study of few-chain NbSe3 encapsulated within the hollow core of carbon nanotubes is presented, where the tube/chain system is subjected to applied axial electrical currents. Electromigration and thermal excitation forces result in collective and individual chain dynamics, with concomitant radial deformations of the encapsulating tubes.

引用

页数：4

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