Single-event induced failure mode of PWM in DC/DC converter

被引：3

作者：

Gao, J. ^{[1
]}

Li, C. ^{[2
]}

Li, B. ^{[1
]}

Zhao, F. ^{[1
]}

Li, J. ^{[1
]}

Zhang, G. ^{[1
]}

Wang, C. ^{[1
]}

Zeng, C. ^{[1
]}

Cui, S. ^{[2
]}

Wu, Q. ^{[2
]}

Luo, J. ^{[1
]}

Han, Z. ^{[1
,3
]}

Liu, J. ^{[4
]}

Ye, T. ^{[1
]}

机构：

[1] Chinese Acad Sci, Key Lab Silicon Device Technol, Inst Microelect, Beijing 100029, Peoples R China

[2] Chinese Acad Sci, Innovat Acad Microsatellites, Shanghai 201203, Peoples R China

[3] Univ Chinese Acad Sci, Beijing 100049, Peoples R China

[4] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China

来源：

MICROELECTRONICS RELIABILITY | 2020年 / 114卷

基金：

中国国家自然科学基金;

关键词：

Power MOSFET;

D O I：

10.1016/j.microrel.2020.113820

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Pulse width modulator (PWM) was found to be an SEE sensitive unit in DC/DC converter. The single event transient (SET) tests of a standalone PWM circuit in steady state and embedded PWM in DC/DC converter in dynamic state were carried out respectively by Ta+ ions (LET = 83.53 MeV.cm(2)/mg). The standalone PWM illustrated three failure modes including the modulated frequency shift, the low-level output error as well as the high level one. These SETs will increase or decrease the duty ratio of PWM output and impact the switching frequency of the power MOSFET, leading to an overshoot and an undershoot SET of DC/DC converter. Matlab model reveals the relationship between PWM SET and DC/DC SET so as to facilitate the failure mode presented in this paper.

引用

页数：6