Mechanical stress-induced switching kinetics of ferroelectric thin films at the nanoscale

被引：26

作者：

Alsubaie, A. ^{[1
,2
]}

Sharma, P. ^{[1
]}

Liu, G. ^{[1
]}

Nagarajan, V. ^{[1
]}

Seidel, J. ^{[1
]}

机构：

[1] Univ New South Wales, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia

[2] Taif Univ, Sch Phys, At Taif, Saudi Arabia

来源：

NANOTECHNOLOGY | 2017年 / 28卷 / 07期

基金：

澳大利亚研究理事会;

关键词：

ferroelectrics; scanning probe microscopy; nanotechnology; strain; stress; FERROELASTIC DOMAIN-WALLS; DIELECTRIC-PROPERTIES; POLARIZATION; NUCLEATION; BEHAVIOR;

D O I：

10.1088/1361-6528/aa536d

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We investigate ferroelectric domain structure and piezoelectric response under variable mechanical compressive stress in Pb(Zr0.2TiO0.8)O-3 ( PZT) thin films using high-resolution piezoresponse force microscopy (PFM) and an in situ sample bending stage. Measurements reveal a drastic change in the ferroelectric domain structure which is presented along with details of the mediating switching process involving domain wall motion, nucleation, and domain wall roughening under an applied external mechanical stimulus. Furthermore, local PFM hysteresis loops reveal significant changes in the observed coercive biases under applied stress. The PFM hysteresis loops become strongly imprinted under increasing applied compressive stress.

引用

页数：8

共 39 条

[1] Atomic-scale investigation of interface-facilitated deformation twinning in severely deformed Ag-Cu nanolamellar composites [J].

An, X. H. ;

Zhu, S. M. ;

Cao, Y. ;

Kawasaki, M. ;

Liao, X. Z. ;

Ringer, S. P. ;

Nie, J. F. ;

Langdon, T. G. ;

Zhu, Y. T. .

APPLIED PHYSICS LETTERS, 2015, 107 (01)

[2] Strain-induced magnetic phase transition in SrCoO3-δ thin films [J].

Callori, S. J. ;

Hu, S. ;

Bertinshaw, J. ;

Yue, Z. J. ;

Danilkin, S. ;

Wang, X. L. ;

Nagarajan, V. ;

Klose, F. ;

Seidel, J. ;

Ulrich, C. .

PHYSICAL REVIEW B, 2015, 91 (14)

[3]

Catalan G, 2011, NAT MATER, V10, P963, DOI [10.1038/nmat3141, 10.1038/NMAT3141]

[4] Skyrmion model of nano-domain nucleation in ferroelectrics and ferromagnets [J].

Dawber, M ;

Gruverman, A ;

Scott, JF .

JOURNAL OF PHYSICS-CONDENSED MATTER, 2006, 18 (05) :L71-L79

[5] Physics of thin-film ferroelectric oxides [J].

Dawber, M ;

Rabe, KM ;

Scott, JF .

REVIEWS OF MODERN PHYSICS, 2005, 77 (04) :1083-1130

[6] Mechanical stress effect on imprint behavior of integrated ferroelectric capacitors [J].

Gruverman, A ;

Rodriguez, BJ ;

Kingon, AI ;

Nemanich, RJ ;

Tagantsev, AK ;

Cross, JS ;

Tsukada, M .

APPLIED PHYSICS LETTERS, 2003, 83 (04) :728-730

[7] Nanoscale ferroelectrics: processing, characterization and future trends [J].

Gruverman, A. ;

Kholkin, A. .

REPORTS ON PROGRESS IN PHYSICS, 2006, 69 (08) :2443-2474

[8] Peculiar effect of mechanical stress on polarization stability in micrometer-scale ferroelectric capacitors [J].

Gruverman, A. ;

Cross, J. S. ;

Oates, W. S. .

APPLIED PHYSICS LETTERS, 2008, 93 (24)

[9] Nanoscale Mechanical Softening of Morphotropic BiFeO3 [J].

Heo, Yooun ;

Jang, Byong-Kweon ;

Kim, Seung Jin ;

Yang, Chan-Ho ;

Seidel, Jan .

ADVANCED MATERIALS, 2014, 26 (45) :7568-7572

[10]

Hong SB, 2004, NANOSCALE PHENOMENA IN FERROELECTRIC THIN FILMS, P111

← 1 2 3 4 →