Raman scattering and lattice defects in nanocrystalline CeO2 thin films

被引：521
作者：
Kosacki, I
Suzuki, T
Anderson, HU
Colomban, P
机构：
[1] Univ Missouri, Elect Mat Appl Res Ctr, Rolla, MO 65401 USA
[2] CNRS, UMR 7075, LADIR, F-94230 Thiais, France
来源：
SOLID STATE IONICS | 2002年 / 149卷 / 1-2期
关键词：
ceria; nanocrystals; thin films; Raman scattering; lattice defects; oxygen conductors; spatial correlation model; non-stoichiometry;
D O I：
10.1016/S0167-2738(02)00104-2
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The results of Raman scattering studies of nanocrystalline CeO2 thin films are presented. The spectra have been described using the spatial correlation model from which the correlation length has been determined as a function of grain size. A direct comparison between the concentration of defects related to correlation length and CeO2 non-stoichiometry has been achieved. The relationship between the lattice disorder and the form of the Raman spectra in nanocrystalline CeO2 is discussed. (C) 2002 Elsevier Science B.V. All rights reserved.
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收藏
页码：99 / 105
页数：7
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