UNIAXIAL PLASTIC DEFORMATION OF POLYCRYSTALLINE Cu AND Al THIN FILMS STUDIED ON A GRAIN-BY-GRAIN BASIS UTILIZING X-RAY MICRODIFFRATION

被引：0

作者：

Spolenak, R. ^{[1
]}

Tamura, N. ^{[2
]}

Valek, B. ^{[3
]}

Brown, W. L. ^{[1
]}

MacDowell, A. A. ^{[2
]}

Celestre, R. C. ^{[2
]}

Padmore, H. A. ^{[2
]}

Bravman, J. C. ^{[3
]}

Batterman, B. W. ^{[4
,5
]}

Patel, J. R. ^{[4
,5
]}

机构：

[1] Agere Syst, Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

[2] Adv Light Source, Berkeley, CA 94720 USA

[3] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA

[4] Adv Light Source, Berkeley, CA 94720 USA

[5] Stanford Synchrotron Radiat Labs, Stanford, CA USA

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2002年 / 58卷

关键词：

MICRODIFFRACTION; PLASTICITY; THIN FILMS;

D O I：

10.1107/S0108767302086452

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：C34 / C34

页数：1