Ferroelectric and ferromagnetic properties in BaTiO3 thin films on Si (100)

被引:23
|
作者
Singamaneni, Srinivasa Rao [1 ,2 ]
Punugupati, Sandhyarani [2 ]
Prater, John T. [1 ,2 ]
Hunte, Frank [2 ]
Narayan, Jagdish [2 ]
机构
[1] Army Res Off, Div Mat Sci, Res Triangle Pk, NC 27709 USA
[2] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA
基金
美国国家科学基金会;
关键词
X-RAY-DIFFRACTION; DIELECTRIC-PROPERTIES; VAPOR-DEPOSITION; EPITAXIAL-GROWTH; SILICON; INTEGRATION; TRANSITION; MEMORY;
D O I
10.1063/1.4894508
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this paper, we report on the epitaxial integration of room temperature lead-free ferroelectric BaTiO3 thin (similar to 1050 nm) films on Si (100) substrates by pulsed laser deposition technique through a domain matching epitaxy paradigm. We employed MgO and TiN as buffer layers to create BaTiO3/SrRuO3/MgO/TiN/Si (100) heterostructures. C-axis oriented and cube-on-cube epitaxial BaTiO3 is formed on Si (100) as evidenced by the in-plane and out-of-plane x-ray diffraction, and transmission electron microscopy. X-ray photoemission spectroscopic measurements show that Ti is in 4(+) state. Polarization hysteresis measurements together with Raman spectroscopy and temperature-dependent x-ray diffraction confirm the room temperature ferroelectric nature of BaTiO3. Furthermore, laser irradiation of BaTiO3 thin film is found to induce ferromagnetic-like behavior but affects adversely the ferroelectric characteristics. Laser irradiation induced ferromagnetic properties seem to originate from the creation of oxygen vacancies, whereas the pristine BaTiO3 shows diamagnetic behavior, as expected. This work has opened up the route for the integration of room temperature lead-free ferroelectric functional oxides on a silicon platform. (C) 2014 AIP Publishing LLC.
引用
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页数:5
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