Whisker probes

被引：18
作者：
Givargizov, EI
Stepanova, AN
Obolenskaya, LN
Mashkova, ES
Molchanov, VA
Givargizov, ME
Rangelow, IW
机构：
[1] Russian Acad Sci, Inst Crystallog, Moscow 117333, Russia
[2] Moscow State Pedag Univ, Inst Nucl Phys, Moscow 119435, Russia
[3] Crystals & Technol Ltd, Moscow, Russia
[4] Univ Kassel, D-3500 Kassel, Germany
来源：
ULTRAMICROSCOPY | 2000年 / 82卷 / 1-4期
关键词：
D O I：
10.1016/S0304-3991(99)00141-2
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
A new technology for preparation of AFM probes based on whiskers is proposed. The technology posseses significant advantages to the whisker probes over standard ones as related to the shapes of the probes, as well as to the properties of the cantilevers on which the whiskers are grown. (C) 2000 Elsevier Science B.V. All rights reserved.
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收藏
页码：57 / 61
页数：5
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