Higher order nonlinear dielectric microscopy

被引：0
作者：
Cho, Y [1 ]
Ohara, K [1 ]
机构：
[1] Tohoku Univ, Res Inst Elect Commun, Sendai, Miyagi 9808577, Japan
来源：
FERROELECTRIC THIN FILMS X | 2002年 / 688卷
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A higher order nonlinear dielectric microscopy technique with higher lateral and depth resolution than conventional nonlinear dielectric imaging is investigated. The proposed technique involves the measurement of higher order nonlinear dielectric constants, with a depth resolution of down to 1.5 nm. The technique is demonstrated to be very useful for observing surface layers of the order of unit cell thickness on ferroelectric materials.
引用
收藏
页码：329 / 334
页数：6
相关论文
共 6 条
  • [1] Scanning nonlinear dielectric microscopy with nanometer resolution
    Cho, Y
    Kazuta, S
    Matsuura, K
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (18) : 2833 - 2835
  • [2] Scanning nonlinear dielectric microscope using a lumped constant resonator probe and its application to investigation of ferroelectric polarization distributions
    Cho, Y
    Atsumi, S
    Nakamura, K
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (5B): : 3152 - 3156
  • [3] Cho Y., 1995, Transactions of the Institute of Electronics, Information and Communication Engineers C-I, VJ78C-I, P593
  • [4] Quantitative measurement of linear and nonlinear dielectric characteristics using scanning nonlinear dielectric microscopy
    Cho, YS
    Kazuta, S
    Ohara, K
    Odagawa, H
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (5B): : 3086 - 3089
  • [5] Theoretical and experimental study on nanoscale ferroelectric domain measurement using scanning nonlinear dielectric microscopy
    Odagawa, H
    Cho, Y
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (9B): : 5719 - 5722
  • [6] Simultaneous observation of nano-sized ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy
    Odagawa, H
    Cho, Y
    [J]. SURFACE SCIENCE, 2000, 463 (01) : L621 - L625
1