Direct near-field optical investigation of phase-change medium in blue-ray recordable and erasable disk

被引:6
作者
Chu, Jen-You [1 ]
Lo, Shen-Chuan [1 ]
Chen, Shu-Chen [1 ]
Chang, You-Chia [1 ]
Wang, Juen-Kai [2 ,3 ]
机构
[1] Ind Technol Res Inst, Mat & Chem Res Labs, Hsinchu 310, Taiwan
[2] Natl Taiwan Univ, Ctr Condensed Matter Sci, Taipei 106, Taiwan
[3] Acad Sinica, Inst Atom Mol Sci, Taipei 106, Taiwan
关键词
amorphous state; domains; nanostructured materials; optical constants; optical disc storage; phase change materials; storage media; RECORDING MARKS; CHANGE FILM; RESOLUTION; ENHANCEMENT;
D O I
10.1063/1.3222901
中图分类号
O59 [应用物理学];
学科分类号
摘要
The authors report a direct examination of recorded marks in blue-ray recordable and erasable disks with scattering-type scanning near-field optical microscopy. The optical contrasts of the crystalline and amorphous regions of the phase-change layer match with the prediction based on their optical constants. The determined spatial optical variation in the recorded marks reflects the intensity profile of the recording laser beam. The identified nanometer-sized optical features are shown to correspond to 10 nm-sized crystalline domains within the amorphous recorded marks. The revealed near-field signatures show a potential influence on the carrier-to-noise ratio of this optical storage medium.
引用
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页数:3
相关论文
共 23 条
[1]   Materials for optical disc substrates [J].
Bruder, FK ;
Douzinas, K ;
Franz, U ;
Haese, W ;
Oser, R .
MRS BULLETIN, 2006, 31 (04) :299-307
[2]   Optical properties of phase change materials for optical recording. [J].
Bruneau, JM ;
Bechevet, B ;
Valon, B ;
Armand, MF .
OPTICAL DATA STORAGE '97, 1997, 3109 :42-51
[3]   Laser-induced crystallization in AgInSbTe phase-change optical disk [J].
Chang, YY ;
Chou, LH .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (5A) :3042-3048
[4]   Multi-wavelength heterodyne-detected scattering-type scanning near-field optical microscopy [J].
Chu, Jen-You ;
Wang, Tien-Jen ;
Chang, You-Chia ;
Lin, Ming-Wei ;
Yeh, Jyi-Tyan ;
Wang, Juen-Kai .
ULTRAMICROSCOPY, 2008, 108 (04) :314-319
[5]   Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by backscattering near-field optical microscopy [J].
Hillenbrand, R ;
Keilmann, F .
APPLIED PHYSICS LETTERS, 2002, 80 (01) :25-27
[6]   Simultaneous IR material recognition and conductivity mapping by nanoscale near-field microscopy [J].
Huber, Andreas J. ;
Kazantsev, Dmitry ;
Keilmann, Fritz ;
Wittborn, Jesper ;
Hillenbrand, Rainer .
ADVANCED MATERIALS, 2007, 19 (17) :2209-+
[7]   High-resolution imaging of recording marks on phase-change film by lateral force microscopy [J].
Ishiyama, O .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2004, 43 (9A) :6356-6357
[8]  
KEILMANN F, 2004, PHILOS T R SOC LON A, V362, P1
[9]   TEM specimen preparation of a phase-change optical disk [J].
Kouzaki, T .
JOURNAL OF ELECTRON MICROSCOPY, 2000, 49 (01) :85-88
[10]   Formation procedure and microstructural analysis of Pb7Bi3 (Pb-Bi) alloy nanowires [J].
Kuo, CG ;
Lo, SC ;
Chen, JH ;
Chiang, CC ;
Chao, CG .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (5A) :3333-3336