Degradation Data Analysis Using Wiener Processes With Measurement Errors

被引:292
作者
Ye, Zhi-Sheng [1 ]
Wang, Yu [1 ]
Tsui, Kwok-Leung [1 ]
Pecht, Michael [2 ]
机构
[1] City Univ Hong Kong, Dept Syst Engn & Engn Management, Hong Kong, Hong Kong, Peoples R China
[2] Univ Maryland, CALCE, College Pk, MD 20742 USA
关键词
Embedded model; random effects; wear data; BURN-IN; RELIABILITY; INFERENCE; DURABILITY; MODELS; LIFE;
D O I
10.1109/TR.2013.2284733
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Degradation signals that reflect a system's health state are important for diagnostics and health management of complex systems. However, degradation signals are often compounded and contaminated by measurement errors, making data analysis a difficult task. Motivated by the wear problem of magnetic heads used in hard disk drives (HDDs), this paper investigates Wiener processes with measurement errors. We explore the traditional Wiener process with positive drifts compounded with i.i.d. Gaussian noises, and improve its estimation efficiency compared with the existing inference procedure. Furthermore, to capture the possible heterogeneity in a population, we develop a mixed effects model with measurement errors. Statistical inferences of this model are discussed. The mixed effects model subsumes several existing Wiener processes as its limiting cases, and thus it is useful for suggesting an appropriate Wiener process model for a specific dataset. The developed methodologies are then applied to the wear problem of magnetic heads of HDDs, and a light intensity degradation problem of light-emitting diodes.
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页码:772 / 780
页数:9
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