An excess noise measurement system for weak responsivity avalanche photodiodes

被引：6

作者：

Qiao, Liang ^{[1
]}

Dimler, Simon J. ^{[1
]}

Baharuddin, Aina N. A. P. ^{[1
]}

Green, James E. ^{[1
]}

David, John P. R. ^{[1
]}

机构：

[1] Univ Sheffield, Dept Elect & Elect Engn, Mappin St, Sheffield S1 3JD, S Yorkshire, England

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 2018年 / 29卷 / 06期

基金：

英国工程与自然科学研究理事会;

关键词：

avalanche photodiode; excess noise; noise measurement; MULTIPLICATION NOISE; 1/F NOISE; DIODES;

D O I：

10.1088/1361-6501/aabc8b

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A system for measuring, with reduced photocurrent, the excess noise associated with the gain in avalanche photodiodes (APDs), using a transimpedance amplifier front-end and based on phase-sensitive detection is described. The system can reliably measure the excess noise power of devices, even when the un-multiplied photocurrent is low (similar to 10 nA). This is more than one order of magnitude better than previously reported systems and represents a significantly better noise signal to noise ratio. This improvement in performance has been achieved by increasing the value of the feedback resistor and reducing the op-amp bandwidth. The ability to characterise APD performance with such low photocurrents enables the use of low power light sources such as light emitting diode rather than lasers to investigate the APD noise performance.

引用

页数：6

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