Characterization of mechanical stress on nanostructures for NEMS applications by ultra-thin membrane and self-suspension techniques

被引:7
作者
Bercu, Bogdan [1 ]
Xu, Xin [1 ]
Montes, Laurent [1 ]
Morfouli, Panagiota [1 ]
机构
[1] Minatec Grenoble INP, IMEP LAHC, F-38016 Grenoble, France
关键词
NEMS; Ultra-thin silicon membranes; SOI; Nanomanipulation; Carbon nanotubes;
D O I
10.1016/j.mee.2009.01.005
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The study of mechanical stress influence on the electronic transport behavior in nanostructures such as nanowires and nanotubes is of particular interest for developing devices in the emerging field of Nano-ElectroMechanical Systems (NEMS). Two techniques for nanostructure actuation are presented: (i) ultrathin membrane actuation and (ii) AFM study of self-suspended nanostructures. The first technique allows in-plane stress of up to a few GPa, while the second allows the imaging and actuation at the same time. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:1303 / 1306
页数:4
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