A self-sensitive probe composed of a piezoelectric tuning fork and a bent optical fiber tip for scanning near-field optical/atomic force microscopy

被引：7

作者：

Muramatsu, H ^{[1
]}

Yamamoto, N ^{[1
]}

Umemoto, T ^{[1
]}

Homma, K ^{[1
]}

Chiba, N ^{[1
]}

Fujihira, M ^{[1
]}

机构：

[1] TOKYO INST TECHNOL,DEPT BIOMOL ENGN,MIDORI KU,YOKOHAMA,KANAGAWA 226,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1997年 / 36卷 / 9A期

关键词：

scanning probe microscopy; near-field optical microscopy; piezoelectric tuning fork; optical fiber; serf-sensitive probe; imaging; AFM; SNOM;

D O I：

10.1143/JJAP.36.5753

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A self sensitive probe was composed of a piezoelectric tuning fork and a bent optical fiber tip for scanning near-held optical/atomic force microscopy. The topography, optical image and fluorescent spectrograph were successfully derived-using the combined probe. The probe showed 1.1 nm vertical resolution at the tip-sample-distance regulation. The combined probe showed single or twin resonant frequency peaks while the original tuning fork has only one resonant frequency of 32.7 kHz. In the twin peaks-case, results for various combination patterns suggested that one of the peaks is the response for a free arm of the tuning fork and the other is the response for the combined arm. The near-field acoustic effect was detected in the tuning fork probe as a small effect, but the effect was not detected in the combined probe.

引用

页码：5753 / 5758

页数：6

共 14 条

[1] NEAR-FIELD OPTICS - MICROSCOPY, SPECTROSCOPY, AND SURFACE MODIFICATION BEYOND THE DIFFRACTION LIMIT [J].