Flash analog-to-digital converter operational in an ultra wide temperature range (room temperature to 4.2 K) in standard CMOS technology using a cryogenic reset switching scheme

被引：1

作者：

Creten, Y. ^{[1
,2
]}

Merken, P. ^{[1
]}

Mertens, R. ^{[1
,2
]}

Sansen, W. ^{[2
]}

Van Hoof, C. ^{[1
,2
]}

机构：

[1] IMEC, B-3001 Heverlee, Belgium

[2] KULeuven, ESAT, B-3001 Heverlee, Belgium

来源：

CRYOGENICS | 2009年 / 49卷 / 11期

关键词：

Cryoelectronics; Space cryogenics; Semiconductors; Liquid helium;

D O I：

10.1016/j.cryogenics.2008.12.018

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

This work presents the design and test result of a standard 0.7 mu m CMOS flash analog-to-digital converter (ADC) operational in an ultra wide temperature range (UWT, room temperature down to 4.2 K). To maintain the circuit's performance over the UWT range in the presence of temperature induced transistor anomalies, dedicated topology and switching schemes are utilized. Test results mentioned in this text are from a single process run, no design iterations were made. (C) 2009 Elsevier Ltd. All rights reserved.

引用

页码：635 / 637

页数：3

共 8 条

[1] An 8-bit Flash Analog-to-Digital Converter in standard CMOS technology functional in Ultra Wide Temperature range from 4.2 K to 300 K
Creten, Y.
Merken, P.
Mertens, R.
Sansen, W.
Van Hoof, C.
ESSCIRC 2008: PROCEEDINGS OF THE 34TH EUROPEAN SOLID-STATE CIRCUITS CONFERENCE, 2008, : 274 - +
[2] An 8-Bit Flash Analog-to-Digital Converter in Standard CMOS Technology Functional From 4.2 K to 300 K
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Merken, Patrick
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[3] Design of a low-power flash analog-to-digital converter chip for temperature sensors in 0.18 μm CMOS process
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