Glass transition of ultrathin films probed by X-ray reflectivity

被引：4
|
作者：
Cecchetto, E [1 ]
de Souza, NR [1 ]
Jérôme, B [1 ]
机构：
[1] Univ Amsterdam, Dept Chem Engn, NL-1018 WW Amsterdam, Netherlands
来源：
JOURNAL DE PHYSIQUE IV | 2000年 / 10卷 / P7期
关键词：
D O I：
10.1051/jp4:2000749
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
X-ray reflectometry was used to measure the temperature dependence of the thickness of ultrathin films of two low-molecular-weight glass formers. In bulk samples, this type of measurements reveals the presence of a glass transition by a sudden break of slope. We have observed a broadening of the glass transition in films thinner than roughly 150 nm, indicating an inhomogeneous distribution of relaxation times in these films. Our results are explained by confinement effect and interpreted in the frame of a theoretical model based on the concept of collective dynamics over a cooperative length.
引用
收藏
页码：247 / 250
页数：4
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