Trap elimination and injection switching at organic field effect transistor by inserting an alkane (C44H90) layer

被引:37
作者
Ogawa, Satoshi
Kimura, Yasuo
Niwano, Michio
Ishii, Hisao
机构
[1] Tohoku Univ, RIEC, Aoba Ku, Sendai, Miyagi 9808577, Japan
[2] Japan Sci & Technol Agcy, CREST, Kawaguchi 3320012, Japan
[3] Chiba Univ, Ctr Frontier Sci, Inage Ku, Chiba 2638522, Japan
关键词
D O I
10.1063/1.2431713
中图分类号
O59 [应用物理学];
学科分类号
摘要
Recently, it was proposed in the literature that the electron trap on a hydroxyl-containing dielectric interface of an organic field effect transistor (OFET) hinders its n type operation. The authors fabricated pentacene and fullerene OFETs with a hydroxyl-free insulating material, a long-chain alkane, i.e., tetratetracontate (TTC), C44H90 layer coated on the SiO2 dielectric layer. The displacement current measurements clearly demonstrated that the electron trap of the SiO2 surface is suppressed by the TTC layer. For a pentacene FET with an Al electrode and SiO2 dielectric layer, a p type operation was observed, while the operation mode was switched to the n type by the insertion of TTC on the SiO2 interface. By simple patterning of the TTC layer to produce a bipolar injection, the authors fabricated an ambipolar pentacene FET with a single kind of metal electrode. Thus TTC is a good material for the surface modification of a dielectric layer in OFETs. (c) 2007 American Institute of Physics.
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页数:3
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