Radiation Size and Divergence at the Hard X-ray Beamline in the PAL-XFEL

被引:7
|
作者
Parc, Yong Woon [1 ]
Han, Jang-Hui [1 ]
Kang, Heung Sik [1 ]
Kim, Ilyou [1 ]
Yang, Haeryong [1 ]
Hwang, Ilmoon [1 ]
Shim, Chi Hyun [2 ]
Ko, In Soo [2 ]
机构
[1] Pohang Accelerator Lab, Phys Team PAL XFEL Project, Pohang 790784, South Korea
[2] Pohang Univ Sci & Technol, Dept Phys, Pohang 790784, South Korea
关键词
PAL-XFEL; Undulator; Gap change; Free-electron laser; Wakefield; Self-amplified spontaneous emission;
D O I
10.3938/jkps.64.976
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
In the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL), recently, the minimum gap of the hard X-ray undulator were changed from 7.2 (undulator period: 24.4 mm) to 8.3 mm (undulator period: 26 mm). To review the physical issues related to the gap change, including the radiation size and divergence, in the PAL-XFEL, we did a simulation study with GENESIS 1.3. The saturation length in the 8.3-mm case will be increased by 10% with respect to the 7.2-mm case. The study also revealed that the divergence of the radiation in 8.3-mm case would be decreased by 4% compared with that in the 7.2-mm case. In this paper, we will present the detailed simulation results to estimate the divergence of radiation at the hard X-ray beamline in the PAL-XFEL.
引用
收藏
页码:976 / 981
页数:6
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