Resampling the transmission matrix in an aberration-corrected Bessel mode basis

被引：6
|
作者：
Pai, Pritam [1 ]
Bosch, Jeroen
Mosk, Allard P.
机构：
[1] Univ Utrecht, Debye Inst Nanomat Sci, POB 80000, NL-3508 TA Utrecht, Netherlands
来源：
OPTICS EXPRESS | 2021年 / 29卷 / 01期
关键词：
INCE-GAUSSIAN MODES; SCATTERING; WAVES;
D O I：
10.1364/OE.412540
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The study of the optical transmission matrix (TM) of a sample reveals important statistics of light transport through it. The accuracy of the statistics depends strongly on the orthogonality and completeness of the basis in which the TM is measured. While conventional experimental methods suffer from sampling effects and optical aberrations, we use a basis of Bessel modes of the first kind to faithfully recover the singular values, eigenvalues and eigenmodes of light propagation through a finite thickness of air. (c) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码：24 / 36
页数：13
相关论文
共 14 条
  • [1] Environmental Transmission Electron Microscopy in an Aberration-Corrected Environment
    Hansen, Thomas W.
    Wagner, Jakob B.
    MICROSCOPY AND MICROANALYSIS, 2012, 18 (04) : 684 - 690
  • [2] Study of Point Spread in the Aberration-Corrected Transmission Electron Microscopy
    Ge, Binghui
    Wang, Yumei
    Chang, Yunjie
    Yao, Yuan
    MICROSCOPY AND MICROANALYSIS, 2014, 20 (05) : 1447 - 1452
  • [3] Aberration-corrected Electron Microscopy Imaging for Nanoelectronics Applications
    Kisielowski, C.
    Specht, P.
    Alloyeau, D.
    Erni, R.
    Ramasse, Q.
    FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009, 2009, 1173 : 231 - +
  • [4] Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope
    Behan, G.
    Cosgriff, E. C.
    Kirkland, Angus I.
    Nellist, Peter D.
    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2009, 367 (1903): : 3825 - 3844
  • [5] Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
    Wang, P.
    Behan, G.
    Kirkland, A. I.
    Nellist, P. D.
    MICROSCOPY AND MICROANALYSIS, 2009, 15 : 42 - 43
  • [6] Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope
    Wang, Peng
    Behan, Gavin
    Kirkland, Angus I.
    Nellist, Peter D.
    Cosgriff, Eireann C.
    D'Alfonso, Adrian J.
    Morgan, Andrew J.
    Allen, Leslie J.
    Hashimoto, Ayako
    Takeguchi, Masaki
    Mitsuishi, Kazutaka
    Shimojo, Masayuki
    ULTRAMICROSCOPY, 2011, 111 (07) : 877 - 886
  • [7] Examining the structure and bonding in complex oxides using aberration-corrected imaging and spectroscopy
    Klie, R. F.
    Qiao, Q.
    Paulauskas, T.
    Ramasse, Q.
    Oxley, M. P.
    Idrobo, J. C.
    PHYSICAL REVIEW B, 2012, 85 (05)
  • [8] Comparison of different imaging models handling partial coherence for aberration-corrected HRTEM at 40-80 kV
    Lee, Z.
    Lehnert, T.
    Kaiser, U.
    Rose, H.
    ULTRAMICROSCOPY, 2019, 203 : 68 - 75
  • [9] On-Column 2p Bound State with Topological Charge ±1 Excited by an Atomic-Size Vortex Beam in an Aberration-Corrected Scanning Transmission Electron Microscope
    Xin, Huolin L.
    Zheng, Haimei
    MICROSCOPY AND MICROANALYSIS, 2012, 18 (04) : 711 - 719
  • [10] Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy
    Zhang, Xiaobin
    Takeguchi, Masaki
    Hashimoto, Ayako
    Mitsuishi, Kazutaka
    Wang, Peng
    Nellist, Peter D.
    Kirkland, Angus I.
    Tezuka, Meguru
    Shimojo, Masayuki
    JOURNAL OF ELECTRON MICROSCOPY, 2012, 61 (03): : 159 - 169
12