Probing the average size of self-assembled metal nanoparticles using x-ray standing waves

被引:20
作者
Tiwari, M. K. [1 ,2 ]
Sawhney, K. J. S. [1 ]
Lee, Tien-Lin [1 ]
Alcock, S. G. [1 ]
Lodha, G. S. [2 ]
机构
[1] Diamond Light Source Ltd, Didcot OX11 0DE, Oxon, England
[2] Raja Ramanna Ctr Adv Technol, Indus Synchrotron Utilizat Div, Indore 452013, India
来源
PHYSICAL REVIEW B | 2009年 / 80卷 / 03期
关键词
INTERFACES; SURFACE; ARRAYS;
D O I
10.1103/PhysRevB.80.035434
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report application of x-ray standing-wave field for characterization of average vertical size of metal nanoparticles dispersed on a substrate surface with accuracies better than 1 nm. This method is applied to analyze the distribution of Fe, Co, and Au nanoparticles on Si substrate and W/C multilayer substrates. Results demonstrate that the method is a valuable tool to evaluate the surface morphology of nanoparticles over a large surface area. Unlike conventional probes such as atomic force microscopy or microinterferometry, the present method provides element-specific analysis. It also has the advantage of being able to examine nanoparticles in a liquid medium, or buried inside a coating layer. We anticipate that the proposed method has great potential to infer the internal structure of nanoparticles.
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页数:5
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