Review of silver nanoparticle based die attach materials for high power/temperature applications

被引:175
作者
Paknejad, Seyed Amir [1 ]
Mannan, Samjid H. [1 ]
机构
[1] Kings Coll London, Dept Phys, London WC2R 2LS, England
关键词
Sintered silver; Harsh environment; Nanosilver; Die-attach; Electronic packaging; Low temperature joining technique; SINTERED NANO-SILVER; BOND-COPPER DBC; LOW-TEMPERATURE; POWER ELECTRONICS; SHEAR-STRENGTH; NANOSILVER; JOINTS; AG; RELIABILITY; PASTE;
D O I
10.1016/j.microrel.2017.01.010
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
There has been a significant rise in the number of research papers on silver nanoparticle based solutions for harsh environment die attach. However, sintering nanoparticles is a complex process, affected by many different factors, such as the sintering temperature profile, particle size, sintering pressure, sintering environment, and organic compounds inside the nanoparticle paste used for stabilisaticin of the particles and easier processing. Therefore, numerous routes exist for establishment of sintered structures, and each lab has selected their own techniques and criteria for sintering silver nanoparticles. This has resulted in formation of a significant amount of knowledge and data in this field, but without appropriate correlation between utilised parameters. In this review data has been collected from a wide range of researchers in the field and an attempt made to correlate the results. By finding connections between the datasets, we present a broad and general understanding of the sintering processes to help researchers produce desired sintered structures. The collected data and investigated parameters include sintering pressure, metallisation, effect of thermal aging and cycling, highest sintering temperature, and particle size distributions. Some particularly interesting innovations in the field to address the shortcomings of sintering silver joints are investigated and some insights on sintering process are also provided, such as the understanding that higher sintering pressure causing improved strength might potentially reduce the long term thermal resistance of the die attach. (C) 2017 Elsevier Ltd. All rights reserved.
引用
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页码:1 / 11
页数:11
相关论文
共 71 条
  • [1] Interfacial bonding mechanism using silver metallo-organic nanoparticles to bulk metals and observation of sintering behavior
    Akada, Yusuke
    Tatsumi, Hiroaki
    Yamaguchi, Takuto
    Hirose, Akio
    Morita, Toshiaki
    Ide, Eiichi
    [J]. MATERIALS TRANSACTIONS, 2008, 49 (07) : 1537 - 1545
  • [2] [Anonymous], 2012, P 14 INT C TRANSP OP
  • [3] Control of nanosilver sintering attained through organic binder burnout
    Bai, John G.
    Lei, Thomas G.
    Calata, Jesus N.
    Lu, Guo-Quan
    [J]. JOURNAL OF MATERIALS RESEARCH, 2007, 22 (12) : 3494 - 3500
  • [4] High-temperature operation of SiC power devices by low-temperature sintered silver die-attachment
    Bai, John Guofeng
    Yin, Ran
    Zhang, Zhiye
    Lu, Guo-Quan
    van Wyk, Jacobus Daniel
    [J]. IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2007, 30 (03): : 506 - 510
  • [5] Thermomechanical reliability of low-temperature sintered silver die attached SiC power device assembly
    Bai, John Guofeng
    Lu, Guo-Quan
    [J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2006, 6 (03) : 436 - 441
  • [6] Buttay C., 2011, P 14 EUR C POW EL AP, P1
  • [7] State of the art of high temperature power electronics
    Buttay, Cyril
    Planson, Dominique
    Allard, Bruno
    Bergogne, Dominique
    Bevilacqua, Pascal
    Joubert, Charles
    Lazar, Mihai
    Martin, Christian
    Morel, Herve
    Tournier, Dominique
    Raynaud, Christophe
    [J]. MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 2011, 176 (04): : 283 - 288
  • [8] Reliability comparison between SAC305 joint and sintered nanosilver joint at high temperatures for power electronic packaging
    Chen, Gang
    Yu, Lin
    Mei, Yun-Hui
    Li, Xin
    Chen, Xu
    Lu, Guo-Quan
    [J]. JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 2014, 214 (09) : 1900 - 1908
  • [9] Ratcheting behavior of sandwiched assembly joined by sintered nanosilver for power electronics packaging
    Chen, Gang
    Zhang, Ze-Sheng
    Mei, Yun-Hui
    Li, Xin
    Lu, Guo-Quan
    Chen, Xu
    [J]. MICROELECTRONICS RELIABILITY, 2013, 53 (04) : 645 - 651
  • [10] High-Temperature Creep Behavior of Low-Temperature-Sintered Nano-Silver Paste Films
    Chen, Gang
    Sun, Xiu-Hu
    Nie, Peng
    Mei, Yun-Hui
    Lu, Guo-Quan
    Chen, Xu
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2012, 41 (04) : 782 - 790