Morphology of nanocermet thin films:: X-ray scattering study

被引：20

作者：

Hazra, S ^{[1
]}

Gibaud, A

Désert, A

Sella, C

Naudon, A

机构：

[1] Univ Maine, Fac Sci, CNRS, UPRESA 6087,Lab Phys Etat Condense, F-72085 Le Mans, France

[2] Univ Paris 06, Lab Opt Solides, F-75006 Paris, France

[3] Univ Poitiers, Met Phys Lab, Poitiers, France

来源：

PHYSICA B | 2000年 / 283卷 / 1-3期

关键词：

X-ray scattering; thin him morphology; nanoparticles; ceramic metals;

D O I：

10.1016/S0921-4526(99)01899-2

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The morphology of ceramic-metal (cermet) thin films is studied by surface-sensitive X-ray scattering techniques. Grazing incidence small angle X-ray scattering (GISAXS) experiments carried out at LURE with a 2D detector show that metal clusters of nanometer size, known as nanoparticles, are dispersed in the thin film. Analyses of the X-ray reflectivity along with the diffuse scattering allow to predict the formation of layers of nanoparticles along the growth direction of the films. The formation of such cumulative-disordered layers in one direction is likely to be related to the boundary condition in the reduced dimension. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：97 / 102

页数：6

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