Nanoscale characterization of ferroelectric domain structures using scanning near-field optical microscopy

被引：0

作者：

Osada, Minoru ^{[1
]}

Noguchi, Yuji ^{[1
]}

Katayama, Shingo ^{[1
]}

Miyayama, Masaru ^{[1
]}

机构：

[1] Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan

来源：

TRANSACTIONS OF THE MATERIALS RESEARCH SOCIETY OF JAPAN, VOL 31, NO 1 | 2006年 / 31卷 / 01期

关键词：

SNOM; Raman scattering; B i(4)Ti(3)O(12) (BIT); nanoscale domain structures;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present a new approach to nanoscale domain characterization using Raman scattering with scanning near-field optical microscopy (SNOM). In Bi4Ti3O12 (BIT) single crystals, we find that the polarization dependence of Raman spectra exhibits local symmetries that reflect domain structures. Moreover, Raman spectra at domain walls exhibit local symmetry breaking due to the presence of oxygen vacancies, and planer defects, due to oxygen vacancies, that accumulated near domain walls cause a strong domain pinning. These SNOM-Raman results shed new light on understanding of domain structures in BIT.

引用

页码：55 / 59

页数：5

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