Optical characterization of Sol-Gel ZnO:Al thin films

被引：0

作者：

Ivanova, T. ^{[1
]}

Harizanova, A. ^{[1
]}

Koutzarova, T. ^{[2
]}

Vertruyen, B. ^{[3
]}

机构：

[1] Bulgarian Acad Sci, Cent Lab Solar Energy & New Energy Sources, 72 Tzarigradsko Chaussee, Sofia 1784, Bulgaria

[2] Bulgarian Acad Sci, Emil Djakov Inst Elect, 72 Tzarigradsko Chaussee, Sofia 1784, Bulgaria

[3] Univ Liege, Inst Chem B6, LCIS SUPRATECS, B-4000 Liege, Belgium

来源：

19TH INTERNATIONAL SUMMER SCHOOL ON VACUUM, ELECTRON AND ION TECHNOLOGIES (VEIT2015) | 2016年 / 700卷

关键词：

DEPOSITION; SURFACE;

D O I：

10.1088/1742-6596/700/1/012048

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

This paper presents a sol-gel technological process for preparing thin films of ZnO and ZnO:Al. The effect of annealing treatments (500, 600, 700 and 800 degrees C) on their properties was studied. The structural evolution with the temperature was investigated by using X-Ray diffraction (XRD). Fourier Transform Infrared (FTIR) and UV-VIS spectrophotometry were applied to characterizing the films' vibrational and optical properties. The ZnO and ZnO: Al films possessed a polycrystalline structure. The films studied are highly transparent in the visible spectral range. The optical band gap values and the haze parameter were also determined.

引用

页数：6

共 17 条

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