Enhancement of conductivity and transmittance of ZnO films by post hydrogen plasma treatment

被引:114
作者
Cai, P. F. [1 ]
You, J. B. [1 ]
Zhang, X. W. [1 ]
Dong, J. J. [1 ]
Yang, X. L. [1 ]
Yin, Z. G. [1 ]
Chen, N. F. [1 ]
机构
[1] Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China
基金
中国国家自然科学基金;
关键词
annealing; carrier density; carrier mobility; diffusion; electrical conductivity; electrical resistivity; hydrogen; II-VI semiconductors; impurity states; interstitials; light transmission; plasma materials processing; semiconductor thin films; sputter deposition; vacancies (crystal); visible spectra; wide band gap semiconductors; zinc compounds; THIN-FILMS; OPTICAL-PROPERTIES; ZINC-OXIDE; ELECTRICAL STABILITY; INTERFERENCE METHOD; UV EMISSION; THICKNESS; PHOTOLUMINESCENCE;
D O I
10.1063/1.3108543
中图分类号
O59 [应用物理学];
学科分类号
摘要
We studied the effects of hydrogen plasma treatment on the electrical and optical properties of ZnO films deposited by radio frequency magnetron sputtering. It is found that the ZnO:H film is highly transparent with the average transmittance of 92% in the visible range. Both carrier concentration and mobility are increased after hydrogen plasma treatment, correspondingly, the resistivity of the ZnO:H films achieves the order of 10(-3) cm. We suggest that the incorporated hydrogen not only passivates most of the defects and/or acceptors present, but also introduces shallow donor states such as the V-O-H complex and the interstitial hydrogen H-i. Moreover, the annealing data indicate that H-i is unstable in ZnO, while the V-O-H complex remains stable on the whole at 400 degrees C, and the latter diffuses out when the annealing temperature increases to 500 degrees C. These results make ZnO:H more attractive for future applications as transparent conducting electrodes.
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页数:6
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