Simplified SEE Sensitivity Screening for COTS Components in Space

被引：28

作者：

Alia, Ruben Garcia ^{[1
]}

Brugger, Markus ^{[1
]}

Daly, Eamonn ^{[2
]}

Danzeca, Salvatore ^{[1
]}

Ferlet-Cavrois, Veronique ^{[2
]}

Gaillard, Remi

Mekki, Julien ^{[3
]}

Poivey, Christian ^{[2
]}

Zadeh, Ali ^{[2
]}

机构：

[1] CERN, CH-1211 Geneva, Switzerland

[2] European Space Agcy, Estec, NL-2200 AG Noordwijk, Netherlands

[3] CNES, F-31055 Toulouse, France

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2017年 / 64卷 / 02期

关键词：

CHARM radiation facility; FLUKA; Monte Carlo methods; radiation hardness assurance (RHA) methodology; single-event effect (SEE); single-event latchup (SEL); HIGH-ENERGY; PROTON; CHALLENGES; SPECTRA; LATCHUP; IMPACT;

D O I：

10.1109/TNS.2017.2653863

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We introduce an approach aimed at prescreening COTS components according to their single-event effect (SEE) sensitivity for space missions in which a complete characterization of their individual response to protons and heavy ions is not feasible due to cost and time constraints. The method is applied to a set of SRAM memories for single-event upset (SEU) and single-event latchup (SEL) and the resulting expected SEE rates are compared with traditional approaches and in-flight data for a low-earth orbit polar and a geostationary orbit. Despite the limitations related to components with high-LET threshold and thick sensitive volumes, we conclude that the proposed method can be an efficient means of rejecting highly sensitive components or lots and performing the complete characterization only on passing devices.

引用

页码：882 / 890

页数：9

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