Capsule-like voids in SiC single crystal: Phase contrast imaging and computer simulations

被引：3

作者：

Kohn, V. G. ^{[1
]}

Argunova, T. S. ^{[2
]}

Je, J. H. ^{[3
]}

机构：

[1] Natl Res Ctr Kurchatov Inst, Moscow 123182, Russia

[2] RAS, Ioffe Phys Tech Inst, St Petersburg 194021, Russia

[3] Pohang Univ Sci & Technol, Xray Imaging Ctr, Dept Mat Sci & Engn, Pohang 790784, South Korea

来源：

AIP ADVANCES | 2014年 / 4卷 / 09期

关键词：

SYNCHROTRON-RADIATION BEAM; SILICON-CARBIDE; SUBLIMATION GROWTH; X-RAYS; MICROPIPES; IMAGES; RADIOGRAPHY; TOMOGRAPHY; EVOLUTION;

D O I：

10.1063/1.4896512

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The results of observation of capsule-like voids in silicon carbide (6H-SiC) single crystal by means of a phase contrast imaging technique with synchrotron radiation at the Pohang Light Source as well as computer simulations of such images are presented. A pink beam and a monochromated beam were used. The latter gives more pronounced images but they still are smoothed due to a finite detector resolution and the spatial coherence of the beam. Sizes and a structure of far field images are different from these of the objects. The computer simulations allow us to reproduce a shape and a size of the capsule-like void. (C) 2014 Author(s).

引用

页数：7