Capsule-like voids in SiC single crystal: Phase contrast imaging and computer simulations

被引：3
作者：
Kohn, V. G. [1 ]
Argunova, T. S. [2 ]
Je, J. H. [3 ]
机构：
[1] Natl Res Ctr Kurchatov Inst, Moscow 123182, Russia
[2] RAS, Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[3] Pohang Univ Sci & Technol, Xray Imaging Ctr, Dept Mat Sci & Engn, Pohang 790784, South Korea
来源：
AIP ADVANCES | 2014年 / 4卷 / 09期
关键词：
SYNCHROTRON-RADIATION BEAM; SILICON-CARBIDE; SUBLIMATION GROWTH; X-RAYS; MICROPIPES; IMAGES; RADIOGRAPHY; TOMOGRAPHY; EVOLUTION;
D O I：
10.1063/1.4896512
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The results of observation of capsule-like voids in silicon carbide (6H-SiC) single crystal by means of a phase contrast imaging technique with synchrotron radiation at the Pohang Light Source as well as computer simulations of such images are presented. A pink beam and a monochromated beam were used. The latter gives more pronounced images but they still are smoothed due to a finite detector resolution and the spatial coherence of the beam. Sizes and a structure of far field images are different from these of the objects. The computer simulations allow us to reproduce a shape and a size of the capsule-like void. (C) 2014 Author(s).
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页数：7
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