Hydroxyapatite thin films grown by pulsed laser deposition and radio-frequency magnetron sputtering: comparative study

被引:106
作者
Nelea, V
Morosanu, C
Iliescu, M
Mihailescu, IN
机构
[1] Natl Inst Lasers Plasma & Radiat Phys, Lasers Dept, Bucharest 76900, Romania
[2] Inst Natl Sci Appl, Lab Ingn Surfaces, F-67084 Strasbourg, France
[3] Natl Inst Mat Phys, R-76900 Bucharest, Romania
[4] Inst Phys & Chim Mat, Grp Surfaces Interfaces, F-67037 Strasbourg, France
关键词
hydroxyapatite thin films; pulsed laser deposition; radio-frequency magnetron sputtering; biomedical materials;
D O I
10.1016/j.apsusc.2004.01.029
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Hydroxyapatite (HA) thin films for applications in the biomedical field were grown by pulsed laser deposition (PLD) and radio-frequency magnetron sputtering (RF-MS) techniques. The depositions were performed from pure hydroxyapatite targets on Ti-5Al-2.5Fe (TiAlFe) alloys substrates. In order to prevent the HA film penetration by Ti atoms or ions diffused from the Ti-based alloy during and after deposition, the substrates were pre-coated with a thin buffer layer of TiN. In both cases, TiN was introduced by reactive PLD from TiN targets in low-pressure N-2. The PLD films were grown in vacuum onto room temperature substrates. The RF-MS films were deposited in low-pressure argon on substrates heated at 550 degreesC. The initially amorphous PLD thin films were annealed at 550 degreesC for 1 h in ambient air in order to restore the initial crystalline structure of HA target. The thickness of the PLD and RF-MS films were similar to1 mum and similar to350 nm, respectively. All films were structurally studied by scanning electron microscopy (SEM), grazing incidence X-ray diffraction (GIXRD), energy dispersive X-ray spectrometry (EDS) and white light confocal microscopy (WLCM). The mechanical properties of the films were tested by Berkovich nano-indentation. Both PLD and RF-MS films mostly contain HA phase and exhibit good mechanical characteristics. Peaks of CaO were noticed as secondary phase in the GIXRD patterns only for RF-MS films. By its turn, the sputtered films were smoother as compared to the ones deposited by PLD (50 nm versus 250 nm average roughness). The R-F-MS films were harder, more mechanically resistant and have a higher Young modulus. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:346 / 356
页数:11
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