An X-ray diffraction study of poly(ethylene-2,6-naphthalate), PEN

X-ray diffraction techniques have been applied to study the crystallization of poly(ethylene-2,6-naphthalate), PEN. Uniaxial and biaxial orientation of amorphous cast PEN films resulted in stress-induced crystallization of the triclinic alpha-PEN polymorph. Annealing of the amorphous PEN samples in the range of 160-240degreesC produced thermally induced crystallization of alpha-PEN. Slow cooling of amorphous PEN from the melt state generated alpha-PEN as well as the triclinic beta-PEN polymorph. (C) 2002 International Centre for Diffraction Data.