Insulation Failure Quantification Based on the Energy of Digital Images Using Low-Cost Imaging Sensors

被引:10
作者
Riba, Jordi-Roger [1 ]
Gomez-Pau, Alvaro [1 ]
Moreno-Eguilaz, Manuel [1 ]
机构
[1] Univ Politecn Cataluna, Elect Engn Dept, Terrassa 08222, Spain
关键词
imaging sensor; digital images; image processing; energy; partial discharges; corona effect; high voltage; low pressure; IDENTIFICATION; PRESSURE; TRACKING;
D O I
10.3390/s20247219
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Insulation faults in high-voltage applications often generate partial discharges (PDs) accompanied by corona activity, optical radiation mainly in the ultraviolet (UV) and visible bands. Recent developments in low-cost, small-size, and high-resolution visible imaging sensors, which are also partially sensitive to the UV spectral region, are gaining attention due to their many industrial applications. This paper proposes a method for early PD detection by using digital imaging sensors, which allows the severity of insulation faults to be assessed. The electrical power dissipated by the PDs is correlated to the energy of the acquired visible images, and thus, the severity of insulation faults is determined from the energy of the corona effect. A criterion to quantify the severity of insulation faults based on the energy of the corona images is proposed. To this end, the point-to-plane gap configuration is analyzed in a low-pressure chamber, where digital image photographs of the PDs are taken and evaluated under different pressure conditions ranging from 10 to 100 kPa, which cover the typical pressure range of aeronautic applications. The use of digital imaging sensors also allows an early detection, location and quantification of the PD activity, and thus assessing the severity of insulation faults to perform predictive maintenance tasks, while enabling the cost and complexity of the instrumentation to be reduced. Although the approach proposed in this paper has been applied to detect PDs in aeronautic applications, it can be applied to many other high-voltage applications susceptible of PD occurrence.
引用
收藏
页码:1 / 15
页数:14
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