EMI power analysis of transient fields from fixed gap ESD

被引：0
|
作者：
Honda, M [1 ]
机构：
[1] Impulse Phys Lab Inc, Kouhoku Ku, Yokohama, Kanagawa 2220033, Japan
来源：
CONFERENCE RECORD OF THE 2002 IEEE INDUSTRY APPLICATIONS CONFERENCE, VOLS 1-4 | 2002年
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Radiated transient fields from fixed gap ESD is experimentally analyzed. The magnitude of di/dt of dischrge current is decreased with charge voltage increase, The probability of digital IC's upset (EMI: Electromagnetic Interference) is not proportional to charge voltage under fixed gap ESD. A model of impulsive EMI power is proposed.
引用
收藏
页码：284 / 289
页数：6
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