Raman Scattering Study of Soft Mode Behavior in Ferroelectric Sr2Bi4Ti5O18

被引：2

作者：

Fukunaga, M. ^{[1
]}

Takesada, M. ^{[1
]}

Onodera, A. ^{[1
]}

机构：

[1] Hokkaido Univ, Fac Sci, Dept Phys, Sapporo, Hokkaido 0600810, Japan

来源：

FERROELECTRICS | 2009年 / 381卷

关键词：

Bismuth layered perovskite; Raman scattering spectroscopy; dielectric constant; phase transition; PHASE-TRANSITION; BISMUTH; OXIDES; SRBI2TA2O9; PHONON;

D O I：

10.1080/00150190902873162

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Aurivillius type Bismuth layered perovskite Sr2Bi4Ti5O18 has been investigated by a low frequency Raman scattering spectroscopy and dielectric measurements. A new dielectric anomaly was observed at T-H = 730 K in a ceramic sample obtained by solid-state reaction method in addition to the phase transition anomaly related by the phase transition at T-L = 551 K reported previously. The low frequency phonon mode in Raman scattering spectra indicates the soft mode behavior. The temperature dependence of the soft mode frequency obeys the Curie-Weiss law toward T-H. The result indicates a displacive type mechanism in a structural phase transition at T-H.

引用

页码：160 / 166

页数：7

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